Chemistry and electronics of single layer MoS 2 domains from photoelectron spectromicroscopy using laboratory excitation sources

M. Fregnaux (1) , H. Kim (1) , D. Rouchon (1) , V. Derycke (2) , J. Bleuse (3) , D. Voiry (4, 5) , M. Chhowalla (5) , O. Renault (1)

1 CEA-LETI - Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information
2 LICSEN UMR 3685 - Laboratoire Innovation en Chimie des Surfaces et NanoSciences
3 NPSC - Nanophysique et Semiconducteurs
4 IEM - Institut Européen des membranes
5 RU - Rutgers, The State University of New Jersey [New Brunswick]

In the recent context of emerging two‐dimensional (2D) materials, a comprehensive set of spatially resolved photoelectron spectroscopic techniques providing information ranging from surface chemical states to electronic band structure must be available at the practical level (i.e. from laboratory‐based instrumentation) for a better understanding of their outstanding properties. We highlight recent capabilities of X‐ray PhotoElectron Emission Microscopy (XPEEM) and reciprocal‐space VUV‐PEEM (kPEEM) for addressing this issue, with a report on microscopic analyses of chemical vapor deposited (CVD) molybdenum disulfide (MoS2) domains. These include band structure imaging with event‐counting detection allowing to perform angle‐resolved ultra‐violet photoelectron spectroscopy (ARUPS) in a parallel way with energy resolution of 200 meV and less, and k resolution of 0.05 Å−1.

Domaines: Chimie

M. Fregnaux, H. Kim, D. Rouchon, V. Derycke, J. Bleuse, et al.. Chemistry and electronics of single layer MoS 2 domains from photoelectron spectromicroscopy using laboratory excitation sources. Surface and Interface Analysis, 2016, 48 (7), pp.465 - 469. ⟨10.1002/sia.5992⟩. ⟨hal-01682267⟩